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Control, the world's leading trade fair for quality assurance, will take place in Stuttgart from 4th to 7th May 2021. International market leaders and innovative suppliers will present the current worldwide offerings of useful technologies, processes, products and system solutions for industrial quality assurance.

Of course, our high-end XRF spectrometers FISCHERSCOPE X-RAY XDV-μ and XDV-μ LD are on site – developed for precise layer thickness measurements and material analysis on tiny structures especially in the electronics and semiconductor industry. But you can experience many more of our reliable, precise quality products for coating thickness measurement, material analysis and mechanical material testing. Fischer experts will explain the different measuring methods in detail.

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