便携式测量仪器

便携式测量仪器配有集成或可互换的探头,可直接在工件上测量涂层厚度。

台式测量仪器

探头(接触式仪器)

精确且坚固耐用的探头,适用于多种几何形状、涂镀层和底材。

手册 下载
探头(接触式测量仪) Brochure Probes [PDF]

校准与附件

使用 FISCHER 测量仪器的校准标准片、测量台、软件以及附件进行涂镀层厚度测量、材料分析、材料测试以及纳米压痕测试。

手册 下载
DataCenter,DataCenter IP Brochure Datacenter [PDF]
技术参数表 下载
校准 TDS X-RAY Calibration Standards [PDF]
TR-Characterization of Cd primary and secondary reference materials [PDF]
TR-Characterization of Cr/Cu, Cr/CuSn and Cr/Fe reference materials [PDF]
TR-Characterization of Cr/Ni reference material [PDF]
TR-Characterization of Cu primary and secondary reference materials [PDF]
TR-Characterization of self-supporting Au foils and Au layers on mylar [PDF]
TR-On the Re-calibration of Au-Layer Master Reference Standards [PDF]
TR-On the re-calibration of Ni-foil reference standards [PDF]
TR-On the re-calibration of Pt-foil and Pt/Si Reference Standards [PDF]
TR-Primary reference standards for precious metal analysis (gold alloys) [PDF]
TR-On the re-calibration of Rh-foil reference standards [PDF]
TR-Re-calibration and characterization of Ti secondary reference standards [PDF]
TR-Re-calibration of self-supporting Cr foils with Cr/Fe reference standards [PDF]
TR-Re-check of Sn foils, self-supporting and mounted over Ni [PDF]
TR-Re-evaluation of Cr/Cu reference standards [PDF]
TR-Re-evaluation of Cr/Fe reference standards [PDF]
TR-Recertification of Au on Pd on Ni master standard foils [PDF]
TR-Recertification of master standards with Pd layers [PDF]
TR-Recertification of Zn and Zn/Fe secondary (“master”) reference standards [PDF]
TR-Traceability of mass per unit area and composition of ZnNi-coatings [PDF]
TR-Traceability of the amount of Phosphorus in NiP-coatings [PDF]

联系 FISCHER

Contact

南通菲希尔测试仪器有限公司
上海/中国

直接联系
电话: (+86) 21 3251 3131
电子邮件: china@helmutfischer.com
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