校准
只有经过精密校准的测量仪器才能提供准确结果。FISCHER提供适用于测试和分析材料、测量涂镀层厚度以及进行纳米压痕测试所需的各种校准材料。其中包括,铁素体与电导率标准块以及用于涂镀层厚度的校准箔。我们的所有校准标准片均可溯源至受认证的主标准片。帮助您成功通过所有的质量管理审核!

您是否希望将自己的产品认证为校准标准片?我们经过 ISO 17025认证的测试实验室可提供各种定制化的校准服务。
联系 FISCHER

南通菲希尔测试仪器有限公司
中国上海市普陀区真北路915号22楼
上海/中国
电话: (+86) 21 3251 3131
电子邮件: china@helmutfischer.com
在线联系表格
信息
下载
- TDS X-RAY Calibration Standards
- TR-Characterization of Cd primary and secondary reference materials
- TR-Characterization of Cr/Cu, Cr/CuSn and Cr/Fe reference materials
- TR-Characterization of Cr/Ni reference material
- TR-Characterization of Cu primary and secondary reference materials
- TR-Characterization of self-supporting Au foils and Au layers on mylar
- TR-On the Re-calibration of Au-Layer Master Reference Standards
- TR-On the re-calibration of Ni-foil reference standards
- TR-On the re-calibration of Pt-foil and Pt/Si Reference Standards
- TR-Primary reference standards for precious metal analysis (gold alloys)
- TR-On the re-calibration of Rh-foil reference standards
- TR-Re-calibration and characterization of Ti secondary reference standards
- TR-Re-calibration of self-supporting Cr foils with Cr/Fe reference standards
- TR-Re-check of Sn foils, self-supporting and mounted over Ni
- TR-Re-evaluation of Cr/Cu reference standards
- TR-Re-evaluation of Cr/Fe reference standards
- TR-Recertification of Au on Pd on Ni master standard foils
- TR-Recertification of master standards with Pd layers
- TR-Recertification of Zn and Zn/Fe secondary (“master”) reference standards
- TR-Traceability of mass per unit area and composition of ZnNi-coatings
- TR-Traceability of the amount of Phosphorus in NiP-coatings