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- TDS X-RAY Calibration Standards
- TR-Characterization of Cd primary and secondary reference materials
- TR-Characterization of Cr/Cu, Cr/CuSn and Cr/Fe reference materials
- TR-Characterization of Cr/Ni reference material
- TR-Characterization of Cu primary and secondary reference materials
- TR-Characterization of self-supporting Au foils and Au layers on mylar
- TR-On the Re-calibration of Au-Layer Master Reference Standards
- TR-On the re-calibration of Ni-foil reference standards
- TR-On the re-calibration of Pt-foil and Pt/Si Reference Standards
- TR-Primary reference standards for precious metal analysis (gold alloys)
- TR-On the re-calibration of Rh-foil reference standards
- TR-Re-calibration and characterization of Ti secondary reference standards
- TR-Re-calibration of self-supporting Cr foils with Cr/Fe reference standards
- TR-Re-check of Sn foils, self-supporting and mounted over Ni
- TR-Re-evaluation of Cr/Cu reference standards
- TR-Re-evaluation of Cr/Fe reference standards
- TR-Recertification of Au on Pd on Ni master standard foils
- TR-Recertification of master standards with Pd layers
- TR-Recertification of Zn and Zn/Fe secondary (“master”) reference standards
- TR-Traceability of mass per unit area and composition of ZnNi-coatings
- TR-Traceability of the amount of Phosphorus in NiP-coatings