太阳能

为太阳能领域开发新的功能性材料是许多公司和大学的研究重点。FISCHER 提供用于对太阳能模块创新涂层进行材料测试的测量设备。此外,我们还提供适合薄膜太阳能电池质量保证的测量技术,如用于测量碲化镉或 CIS/CIGS 涂层厚度等。

太阳能

应用范例

Ensuring high efficiency of thin film photovoltaic modules with inline measurement

In the manufacture of thin film solar panels or foils (e.g. CIS/CIGS, CdTe) it is crucial to maintain the specified limits of thickness and composition exactly, as this directly affects the efficiency of the panel. Only with a precise, fast and reliable inline measuring system can the production parameters be continuously monitored and, thus, the quality of the coating processes ensured.

A typical thin film photovoltaic (PV) system is comprised of a fairly complex stack of layers coated onto substrates like glass or foils. As manufacturers strive to develop lower-cost, dependable CdTe/CIS/CIGS products, some of their most critical issues are:

· ever-higher module efficiencies

· ever-thinner absorber layers of less than 1µm

· consistent absorber film stoichiometry and uniformity over large areas

This is where mature, non-destructive measurement technology, such as X-ray fluorescence (XRF), helps to improve uniformity and stoichiometry – and thus, the cell efficiency and production yield. The FISCHERSCOPE® X-RAY 5400 enables accurate and precise measure­ment of the layer thicknesses and composition in complex CIS/CIGS/CdTe systems, for continuous inline quality control at various stages during production.

X-ray head of a FISCHERSCOPE X-RAY 5400

Fig.1: X-ray head of a FISCHERSCOPE® X-RAY 5400 (left) and detailed view of the easy-to-change protective foil

Because the X-ray heads are mounted via cooled standard interfaces to the vacuum chamber system, they can even be used in production machinery under condi­tions in which substrate temperatures approach 500°C.

Movement and bulging of the product can occur during the production process, which causes the distance between sample and measurement head to fluctuate. To prevent falsifying effects, FISCHER’s WinFTM® Software uses information already contained in the measured XRF spectra, achieving reliable distance compensation without any moving parts and thus obviating the need for secondary distance sensors.

CIGS thickness readings and change in measurement distance

Fig.2: CIGS thickness readings and change in measurement distance – blue points are with distance compensation, red are without.

With the distance compensation feature activated, the measurement distance can be altered by up to +/- 5 mm without significantly affecting the measurement readings.

Production quality of thin film solar cells can be accurately and precisely monitored using XRF technology. FISCHER’s specially designed inline X-ray measurement head, FISCHERSCOPE® X-RAY 5400, also fulfils all the robustness requirements of live production environments. For more information please contact your local FISCHER representative.

联系 FISCHER

Contact

南通菲希尔测试仪器有限公司
中国上海市普陀区真北路915号22楼
上海/中国
电话: (+86) 21 3251 3131
电子邮件: china@helmutfischer.com
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